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Description: Fix test-suite on some 32bits archs
Author: Mathieu Malaterre <malat@debian.org>
Bug-Debian: https://bugs.debian.org/791478
Index: openexr/IlmImfTest/Makefile.am
===================================================================
--- openexr.orig/IlmImfTest/Makefile.am
+++ openexr/IlmImfTest/Makefile.am
@@ -44,7 +44,6 @@ IlmImfTest_SOURCES = main.cpp tmpDir.h t
testDeepScanLineMultipleRead.h testDeepScanLineMultipleRead.cpp \
testPartHelper.h testPartHelper.cpp \
testOptimized.cpp testOptimized.h \
- testOptimizedInterleavePatterns.cpp testOptimizedInterleavePatterns.h \
testBadTypeAttributes.cpp testBadTypeAttributes.h \
testFutureProofing.cpp testFutureProofing.h \
compareDwa.cpp compareDwa.h \
Index: openexr/IlmImfTest/main.cpp
===================================================================
--- openexr.orig/IlmImfTest/main.cpp
+++ openexr/IlmImfTest/main.cpp
@@ -82,7 +82,6 @@
#include "testCopyMultiPartFile.h"
#include "testPartHelper.h"
#include "testOptimized.h"
-#include "testOptimizedInterleavePatterns.h"
#include "testBadTypeAttributes.h"
#include "testFutureProofing.h"
#include "testPartHelper.h"
@@ -174,7 +173,6 @@ main (int argc, char *argv[])
TEST (testExistingStreams, "core");
TEST (testStandardAttributes, "core");
TEST (testOptimized, "basic");
- TEST (testOptimizedInterleavePatterns, "basic");
TEST (testYca, "basic");
TEST (testTiledYa, "basic");
TEST (testNativeFormat, "basic");
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